日常操作簡(jiǎn)便:只需放入樣品,啟動(dòng)按鈕,結(jié)果幾秒種內(nèi)顯示。
KEY FEATURES
Emission time-resolved measurements in
solutions, vapor cells and thin films,
Fluorescence anisotropy measurements,
Optimized for MHz Ti:Sa Oscilators,
Covers fluorescence phenomena from
femtoseconds to 2 ns,
Sub-100fs time resolution,
Easy alignment.
Detection Range: | 320-1300nm; |
Excitation: | SHG; |
Time Resolution: | < 100fs (for laser pulsewidth <70fs) |
Optical Delay: | 2-ns travel, 3 fs step; 4ns optional |
Dark Count Rate: | 3.10 6cps |
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Software: | Standalone and LabView TM |
Dimentions: | 90 x 70 x 18.5cm (35.4 x 27.5 x 7.3 in.) |
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Input Parameters
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Pulse Energy:
| >3 nJ (>230mW@76MHz) |
Pulsewidth: | 30 - 200 fs |
Beam Diameter: | 2 - 5 mm Near TEM00 |
Polarization: | Linear, Horizontal |
Repetition rate: | 1-200 MHz |
Wavelenght: | 770-820 nm |
Beam height: | 110 mm |
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QE65000光譜儀是結(jié)合了探測(cè)器、光學(xué)平臺(tái)和電子學(xué)技術(shù),具有極高靈敏度的新型科研級(jí)光譜儀。它能夠應(yīng)用于極低亮度的苛刻條件,例如熒光、DNA測(cè)序、天文學(xué)和拉曼光譜等領(lǐng)域。QE65000科研級(jí)光譜儀的量子效率可達(dá)90%,并且具有高信噪比和快速的信號(hào)處理能力。QE65000-FL熒光測(cè)量用科學(xué)級(jí)光譜儀是專門為熒光測(cè)量而預(yù)配置的光譜儀。
QE65000-FL熒光光譜儀-產(chǎn)品特點(diǎn)
•量子效率可達(dá)90%•增強(qiáng)的靈敏度•的紫外響應(yīng)•高信噪比•TEC熱電制冷•包含軟件和擴(kuò)展服務(wù)包ASP
QE65000-FL熒光光譜儀技術(shù)參數(shù)
Physical | |
Dimensions: | 182 mm x 110 mm x 47 mm |
Weight: | 1.18 kg (without power supply) |
Detector | |
Detector: | Hamamatsu S7031-1006 |
Detector range: | 200-1100 nm |
Pixels: | 1024 x 58 (1044 x 64 total pixels) |
Pixel size: | 24.576 μm2 |
Pixel well depth: | 1000 Ke- |
Sensitivity: | ~0.065 counts / e- |
Quantum efficiency: | 90% peak; 65% at 250 nm |
Optical Bench | |
Design: | f/4, Symmetrical crossed Czerny-Turner |
Focal length: | 101.6 mm input and output |
Entrance aperture: | 200 m wide slit |
Grating: | HC1-QE |
OFLV filter: | OFLV-QE-350 (350-1100 nm) |
Collimating and focusing mirrors: | Standard only |
UV enhanced window: | No |
Fiber optic connector: | SMA 905 to 0.22 numerical aperture single-strand optical fiber |
Spectroscopic | |
Wavelength range: | 350-1100 nm (grating dependent) |
Optical resolution: | ~6 nm FWHM |
Signal-to-noise ratio: | 1000:1 (at full signal) |
A/D resolution: | 16 bit |
Dark noise: | 3 RMS counts |
Dynamic range: | 7.5 x 109 (system), 25000:1 for a single acquisition |
Integration time: | 8 ms to 15 minutes |
Stray light: | <0.08% at 600 nm; 0.4% at 435 nm |
Corrected linearity: | >99.8% |
Electronics | |
Power consumption: | 500 mA @ 5 VDC (no TE cooling); 3.5 A @ 5 VDC (with TE cooling) |
Data transfer speed: | Full scans to memory every 7 ms with USB 2.0 port, 18 ms with USB1.1 port, 300 ms with serial port |
Inputs/Outputs: | 10 onboard digital user-programmable GPIOs (general purpose inputs/outputs) |
Analog channels: | No |
Auto nulling: | Yes |
Breakout box compatibility: | Yes |
Trigger modes: | 4 modes |
Strobe functions: | No |
Gated delay feature: | Yes |
Connector: | 30-pin connector |
Power-up time: | <5 seconds |
Dark current: | 4000 e-/pixel/sec @ 25 C; 200 e-/pixel/sec @ 0 C |
Computer | |
Operating systems: | Windows 98/Me/2000/XP, Mac OS X and Linux with USB port; Any 32-bit Windows OS with serial port |
Computer interfaces: | USB 2.0 @ 480 Mbps; RS-232 (2-wire) @ 115.2 K baud |
Peripheral interfaces: | SPI (3-wire); I2C inter-integrated circuit |
Temperature and Thermoelectric (TE) Cooling | |
Temperature limits: | 0 C to 50.0 C; no condensation |
Set point: | Software controlled; lowest set point is 40 C below ambient |
Stability | +/-0.1 C of set temperature in <2 minutes |
性能特點(diǎn)
專業(yè)貴金屬檢測(cè)、鍍層厚度檢測(cè)。
智能貴金屬檢測(cè)軟件,與儀器硬件相得益彰。
任意多個(gè)可選擇的分析和識(shí)別模型。
相互獨(dú)立的基體效應(yīng)校正模型。
多變量非線性回收程序。
技術(shù)指標(biāo)
元素分析范圍:從鉀(K)到鈾(U)。
測(cè)量對(duì)象:固體、液體、粉末
分析檢出限可達(dá):1ppm。
分析含量一般為:1ppm到99.9%。
多次測(cè)量重復(fù)性可達(dá):0.1%。
工作穩(wěn)定性為:0.1%。